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About Chapman Instruments

Chapman Instruments was founded in 1989 with a simple mission - to design, market and support the world's finest optical, non-contact instruments for topography measurements of critical surfaces (i.e. computer disk media, semiconductor wafers, optical lenses etc.) Instantly embraced by the computer disk industry where specific surface features are required, Chapman has become a leader in computer disk surface profiling.

Our systems are also designed for the silicon wafer industry, where the speed and automated features of our profiling instruments meet a wide range of current and future needs.

Chapman Instruments has a worldwide network of sales and service agents. Our employees are dedicated to supporting current products and continuing to innovate to provide service to our customers.