• Transparent

• Non-transparent

• Non-Contact Profiling system ensures a non-destructive method of taking surface measurements.

• A wide variety of quick and accurate measurements can be taken for process control regardless of the surface type.

• Chapman profilers are capable of measuring any optical surface, including mirrors, lenses, and prisms.

• Auto-focus feature in systems guarantees accurate focus over curved parts and therefore correct roughness measurements.

• Circumferential Scans - 360° around the material at any radius for roughness and waviness.

• Waviness measurements and mid-spatial wavelengths are easily measured. The long scan length coupled with easy to use software allows for either waviness or roughness measurements in a single scan.

• Transparent and non-transparent surface measuring capability.