• MEMS

• Gallium Arsenide

• Ceramics

• Plastics

• Tool/Die

• Other

Non-Contact Profiling system ensures a non-destructive method of taking surface measurements.

Chapman Profilers are versatile - they are able to obtain a wide variety of quick and accurate measurements for all types of surfaces.

Auto-focus feature in systems guarantees accurate focus over curved parts and therefore correct roughness measurements.

Circumferential Scans - 360° around the material at any radius for roughness and waviness.

Waviness measurements and mid-spatial wavelengths are easily measured. The long scan length coupled with easy to use software allows for either waviness or roughness measurements in a single scan.

Non-contact, providing non-destructive thickness measurements

0.1 μm thickness resolution, providing thickness uniformity and Q/C control