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 Product Application Note:

   MP2200
Circular Path Topography for Disk Media
Glass Disk Roll-off

The MP2200 is Chapman Instruments’ latest high resolution profiler for the disk industry. It is designed to be used as both a disk production tool for in-line quality inspection, as well as a research and development tool for establishing standards and researching tolerances. The MP2200 utilizes the same non-contact measurement technology as other Chapman profilers, but features a shorter wavelength light source (543 nm). This green laser allows the MP2200 to make higher resolution measurements with up to 100X magnification objectives, with a finer sampling interval (50 nm). Users can make complete, high-resolution OD circumferential scans in less than 30 seconds. The powerful, yet user-friendly, Windows XP based operational software can be programmed to execute a series of routines and report the data offline for further analysis. Password security and event viewer/error logging are also available.

MP2200 Features:
• Nomarski Viewing System for high definition visual inspection
• Non-contact scanning line profiles
• Non-contact 3D scans
• Sub-Angstrom height resolution
• 50 nm sampling
• 0.33 µm lateral resolution
• Scan lengths ranging from microns to 100 mm
• Profile and waviness data from a single scan
• Fast, complete circumferential scans
• Automated sample positioning X,Y, theta
• Customized measurement sequences with multiple scans implemented with a single
  keystroke
• Automated focus acquisition
• Closed loop auto-focus system allows focus to be maintained while scanning over
  samples with varying topography